2D characterization of near-surface VP/VS: surface-wave dispersion inversion versus refraction tomography
The joint study of pressure (P-) and shear (S-) wave velocities (VP and VS), as well as their ratio (VP/VS), has been used for many years at large scales but remains marginal in near-surface applications. For these applications, VP and VS are generally retrieved with seismic refraction tomography combining P and SH (shear-horizontal) waves, thus requiring two separate acquisitions. Surface-wave […]
Read more